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Modular Breakout System Chassis Mounting Frame
95-901-001
The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications. This low-cost system combines a BoB (Breakout Box) feature set with the added flexibility of an FIU (Fault Insertion Unit). By mating the FIU chassis directly to the BoB, cabling is minimized, creating a more compact reliable design and improving signal integrity.
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Hign Speed Bare Board Test System By Non-Contact Test Technologies
SX-750SUPERⅣ
Suitable for a wide range of applications. Can be connected to a wide range of machines: from hand press to reel mechanism and in-line mechanism. We offer docking with our customers own machines. Compact main tester simplifies integration via installation inside a mechanism. If requested, we will perform a study to decide which functions should be added.
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Bipolar/FET/Diode Dual Head Production Test System
36XX
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Power System Simulator
F6150sv
This power system simulator performs the simplest through the most complex tests. The F6150sv has the highest output current of any test set on the market – all within a single box.
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Leak Test System
NorCom 2020
The NorCom 2020 batch inspects up to 500 devices per cycle for both gross and ultra-fine leaks. The system incorporates a patented full field interferometer that produces reliable, repeatable leak test results. The system eliminates the need for helium mass spectroscopy or krypton testing for fine, and bubble leak testing for gross leaks.
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Taper System, CCD Beam Imaging Camera
TaperCamD series
355 to 1150 nm, standard CCD detectorHyperCal Dynamic Noise and Baseline Correction software (Pat. Pending)CTE Comet Tail Elimination for > 900 nm (Pat. Pending)Port-powered USB 2.0; flexible 3 m cable, no power brick14-bit ADC, 4 MB image buffer & on-board microprocessorWindow-free sensors standard for no fringing25,000:1 electronic auto-shutter, 40 s to 1000 ms1,000:1 SNR (30/60 dB Optical/Electrical)
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SRS-200A Spectral Radiation Safety Test System
Hangzhou Everfine Photo-E-Info Co., LTD
SRS-200A is a new generation of portable photo-biological safety test and evaluation equipment. Based on the mainfunctions of the laboratory spectral radiation safety test system, the convenience and operability of test are fully considered.To some extent, the analyzer makes up for on site measurement insufficiency.
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Automotive Sensor & Control Devices
We supply a variety of automotive sensors, infrared cameras, and molded parts made from metal, resin and other materials to the automotive and transportation equipment industries, contributing to vehicle safety, comfort, and fuel economy.
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Flying Probe Test Systems
Flying probe testers work by In-circuit testing the board via a number of moving test probes. They have the advantage over traditional In-circuit testers of not requiring a dedicated "bed of nails" test fixture thus reducing the price for each different board being tested. However, modern Flying Prober testers offer so much more than just In-circuit testing. They enable the user to combine In-circuit, AOI, Functional, Device Programming and Boundary Scan testing, in one test system.
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Solar simulation systems
Whatever your application, from an environmental chamber for small components to an extensive array for a complete automobile or aircraft test, EYE / Iwasaki has the experience to provide a solar lighting system customized for your requirements.
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(250 kN) Fatigue Testing System
8802
The Instron 8802 is a high stiffness, 250kN fatigue rated servohydraulic testing system that meets the challenging demands of both static and dynamic testing requirments. The 8802 systems include a range of configurations available to provide complete testing solutions to satisfy the needs of advanced materials and component testing. The design of the 8802 frame makes it ideal for installation within a laboratory environment, generally without the need for strangethened floors or raised ceiling heights.
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6U CompactPCI Enclosures & Systems
1~9U CompactPCI chassis for 6U CompactPCI boards , most of which are with front/rear panel I/O, H.110 CT bus and redundant power supplies.
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Fortress Metal Detection Systems
Cantrell•Gainco is an authorized OEM partner of Fortress metal detection equipment for the meat and poultry industry in America. The Fortress brand represents the ultimate in metal detection quality and performance.
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IQ4 Conveyorized Metal Detector System
The conveyorized IQ4 Metal Detector system can be configured to suit factory and product requirements. It includes different reject options including as a Stop on Detect (band stop), air blast, pusher / plough, carriage retract band, diverters or powered decliners. This system is ideally suited for packaged product from both the food and pharmaceutical industries.
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Electronic Controls
Global Digital Instruments, LLC
Global Digital Instruments Electronic Controls
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Lithography System
JetStep X500
The JetStep X500 panel lithography system is optimized for volume manufacturing of high-end AICS and advanced packaging panels. The system incorporates a large field exposure system with advanced features to meet the challenging requirements encountered in production of AICS or panel level packaging, such as; fine resolution to 3µm with large depth of focus (DOF), high overlay accuracy of ±1µm, automatic magnification compensation with independent x and y magnification adjustment of ±100 ppm, and automatic handling of panel substrates of various dimensions, thicknesses, and levels of warp.
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Non-contact Ultra-High Range Sheet Resistance Measurement System
CRN-100
*Ultra-High range sheet resistance measurement for 10E+9 ~ 10E+15 ohm/sq without contacting*Mapping program software;*1. Arranged in a multipoint pattern measurement is programmed*2. 2-D & 3-D mapping software*Easy operation by Windows 7 system software*Measurement data base link with Excel via CSV format file*Unaffected by contact resistance
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Data Acquisition System
Pixie-16
The Pixie-16 is a data acquisition system for nuclear physics and other applications requiring coincident radiation detection with large number of channels.
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Vehicle Mount Cable Fault Location System
Weshine Electric Manufacturing Co., Ltd
VS2088Plus Built in Booster And Capacitor In Vehicle Underground Cable Fault Test Device
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Sound Level Test System
In a world where precision and performance rule, measuring and controlling sound levels can be crucial to the success of your product or project. The team at Integrated Test & Measurement (ITM) have developed a customized solution that not only measures and collects sound-level data, but will help your team identify the specific components causing all that noise.
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Real-time Signal & System Analsis Software
WinAudioMLS
WinAudioMLS is a professional Windows application for powerful real-time signal and system analysis.WinAudioMLS converts your PC with a soundcard into a professional audio and signal analyzer.
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Optics Test Systems
F Number Meter
Optik Elektronik Gerätetechnik GmbH
The f-number of a camera lens is defined as the quotient of the focal length f' and the diameter of the entrance pupil. The f-number measuring device is a simple structure for the automatic, software-controlled measurement of the f-number of optical systems.
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Digital Line Protection System
DLPD
The DLPD provides distance protection for HV and EHV transmission lines. It may be used for single or three phase tripping applications. It includes four zones of distanceprotection. User selectable pilot schemes are provided with stepdistance backup. Ground instantaneous and time overcurrentfunctions are independently selectable to be directional ornon-directional.
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System Level Test and Burn-in Solutions
System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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Automated I-V/AOI/EL and Sorting System
OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
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Automated Test Systems
WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Blackbody System
IR-508/301
Infrared Systems Development Corp.
The IR-508 blackbody reference source is designed to provide infrared radiation as an ideal blackbody emitter. The output energy from the 0.25" cavity closely follows the theoretical maximum energy curve described by Max Planck's equation, and allows users to calibrate, align, and measure infrared devices and phenomena of all types.
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x1 PCI Express System Timer
SKU-048-01
The x1 PCI Express System Timer uses a hardware clock to synchronize IP signals. This hardware-based solution provides accurate clock timing for Asterisk® open-source PBX software.The Timer supports variable clock timing intervals. You can configure the clock interval during startup. Currently, the x1 PCI Express System Timer supports clock intervals ranging from 1ms to 64ms.
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Cross-Correlator Pulse Profiling Systems
Rincon
The third order cross-correlator is ideal for looking at the full range of output from amplified femtosecond laser systems. High temporal resolution over a long (close to 1 ns) window shows pulse features that are usually missed, giving the user a detailed and complete picture of the quality and stability of the output pulse parameters of their femtosecond lasersystem.